Determining the Optimal Location and Number of Voltage Dip Monitoring Devices Using the Binary Bat Algorithm

Voltage dips represent a significant power quality problem. The main cause of voltage dips and short-term interruptions is an electrical short circuit that occurs in transmission or distribution networks. Faults in the power system are stochastic by nature and the main cause of voltage dips. As faults in the transmission system can affect more customers than faults in the distribution system, to reduce the number of dips, it is not enough to invest in a small part of the transmission or distribution system. Only targeted investment in the whole (or a large part of the) power system will reduce voltage dips. Therefore, monitoring parts of the power system is very important. The ideal solution would be to cover the entire system so that a power quality (PQ) monitor is installed on each bus, but this method is not economically justified. This paper presents an advanced method for determining the optimal location and the optimal number of voltage dip measuring devices. The proposed algorithm uses a monitor reach area matrix created by short-circuit simulations, and the coefficient of the exposed area. Single-phase and three-phase short circuits are simulated in DIgSILENT software on the IEEE 39 bus test system, using international standard IEC 60909. After determining the monitor reach area matrix of all potential monitor positions, the binary bat algorithm with a coefficient of the exposed area of the system bus is used to minimize the proposed objective function, i.e., to determine the optimal location and number of measuring devices. Performance of the binary bat algorithm is compared to the mixed-integer linear programming algorithm solved by using the GNU Linear Programming Kit (GLPK).